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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 330 |
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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 6 | 11 | 7 | 3 | 9 | 7 | 3 |
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| oe-22-15-17948.pdf | 388 |
