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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 453 |
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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 10 | 2 | 2 | 15 | 8 | 30 | 23 |
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| oe-22-15-17948.pdf | 440 |
