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Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 376 |
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Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 7 | 4 | 8 | 24 | 10 | 2 | 1 |
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oe-22-15-17948.pdf | 405 |