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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 467 |
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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 2 | 15 | 8 | 30 | 23 | 13 | 1 |
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| oe-22-15-17948.pdf | 449 |
