| Zugriffe | |
|---|---|
| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 376 |
| Oktober 2024 | November 2024 | Dezember 2024 | Januar 2025 | Februar 2025 | März 2025 | April 2025 | |
|---|---|---|---|---|---|---|---|
| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 7 | 4 | 8 | 24 | 10 | 2 | 1 |
| Zugriffe | |
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| oe-22-15-17948.pdf | 405 |
