dc.contributor.author
Varene, Erwan
dc.contributor.author
Bogner, Lea
dc.contributor.author
Bronner, Christopher
dc.contributor.author
Tegeder, Petra
dc.date.accessioned
2018-06-08T04:12:58Z
dc.date.available
2014-03-24T10:15:29.332Z
dc.identifier.uri
https://refubium.fu-berlin.de/handle/fub188/16815
dc.identifier.uri
http://dx.doi.org/10.17169/refubium-20996
dc.description.abstract
Femtosecond time-resolved two-photon photoemission spectroscopy is utilized to
determine the electronically excited states dynamics at the α-sexithiophene
(6T)/Au(111) interface and within the 6T film. We found that a photoinduced
transition between the highest occupied molecular orbital and lowest
unoccupied molecular orbital is essential in order to observe exciton
population, which occurs within 100 fs. In thin 6T films, the exciton exhibits
a lifetime of 650 fs. On a time scale of 400 fs, an energetic stabilization is
observed leading to the formation of a polaron or electron trapping at defect
states. The lifetime of this state is 6.3 ps. Coverage-dependent measurements
show that apart from the excited state decay within the film, a substrate-
mediated relaxation channel is operative. The present study demonstrates that
two-photon photoemission spectroscopy is a powerful tool to investigate the
whole life cycle from creation to decay of excitons in an organic
semiconductor.
de
dc.rights.uri
http://forms.aps.org/author/copytrnsfr.pdf
dc.subject.ddc
500 Naturwissenschaften und Mathematik::530 Physik
dc.title
Ultrafast Exciton Population, Relaxation, and Decay Dynamics in Thin
Oligothiophene Films
dc.type
Wissenschaftlicher Artikel
dcterms.bibliographicCitation
Physical Review Letters. - 109 (2012), 20, Artikel Nr. 207601/1-5
dc.identifier.sepid
24696
dcterms.bibliographicCitation.doi
10.1103/PhysRevLett.109.207601
dcterms.bibliographicCitation.url
http://dx.doi.org/10.1103/PhysRevLett.109.207601
refubium.affiliation
Physik
de
refubium.affiliation.other
Institut für Experimentalphysik
refubium.mycore.fudocsId
FUDOCS_document_000000019951
refubium.resourceType.isindependentpub
no
refubium.mycore.derivateId
FUDOCS_derivate_000000003302
dcterms.accessRights.openaire
open access
dcterms.isPartOf.issn
0031-9007