dc.contributor.author
Bronner, Christopher
dc.contributor.author
Tegeder, Petra
dc.date.accessioned
2018-06-08T04:12:56Z
dc.date.available
2014-05-08T11:30:39.901Z
dc.identifier.uri
https://refubium.fu-berlin.de/handle/fub188/16812
dc.identifier.uri
http://dx.doi.org/10.17169/refubium-20993
dc.description.abstract
Bi possesses intriguing properties due to its large spin-orbit coupling, e.g.,
as a constituent of topological insulators. While its electronic structure and
the dynamics of electron-phonon coupling have been studied in the past,
photoinduced charge carriers have not been observed in the early phases of
their respective relaxation pathways. Using two-photon photoemission (2PPE) we
follow the deexcitation pathway of electrons along the unoccupied band
structure and into a bulk hole pocket. Two decay channels are found, one of
which involves an Auger process. In the hole pocket, the electrons undergo an
energetic stabilization and recombine with the corresponding holes with an
inverse rate of 2.5 ps. Our results contribute to the understanding of the
charge carrier relaxation processes immediately upon photoexcitation,
particularly along the ΓT line where the electron dynamics have not been
probed with time-resolved 2PPE so far.
de
dc.rights.uri
http://forms.aps.org/author/copytrnsfr.pdf
dc.subject.ddc
500 Naturwissenschaften und Mathematik::530 Physik
dc.title
Relaxation dynamics of photoexcited charge carriers at the Bi(111) surface
dc.type
Wissenschaftlicher Artikel
dcterms.bibliographicCitation
Physical Review B. - 89 (2014), 11, Artikel Nr.115105/1-7
dc.identifier.sepid
35066
dcterms.bibliographicCitation.doi
10.1103/PhysRevB.89.115105
dcterms.bibliographicCitation.url
http://dx.doi.org/10.1103/PhysRevB.89.115105
refubium.affiliation
Physik
de
refubium.affiliation.other
Institut für Experimentalphysik
refubium.mycore.fudocsId
FUDOCS_document_000000020307
refubium.resourceType.isindependentpub
no
refubium.mycore.derivateId
FUDOCS_derivate_000000003545
dcterms.accessRights.openaire
open access
dcterms.isPartOf.issn
1098-0121