Optically-transparent LiF film radiation imaging detectors of three different thicknesses, grown by thermal evaporation on Si(100) substrates and irradiated with monochromatic 7 keV X-rays at several doses in the range between 13 and 4.5×103 Gy, were investigated by fluorescence microscopy to evaluate their visible photoluminescence response of X-ray induced colour centres and their spatial resolution. By edge-enhancement imaging experiments, performed by irradiating LiF film detectors with an Au mesh in front of them, a spatial resolution of ∼0.3 μm was estimated. This high spatial resolution, combined with the large field of view and the wide dynamic range offered by LiF detectors, encourages their use in X-ray imaging and for high-energy density experiments in synchrotron facilities.
