dc.contributor.author
Zillner, E.
dc.contributor.author
Paul, A.
dc.contributor.author
Jutimoosik, J.
dc.contributor.author
Chandarak, S.
dc.contributor.author
Monnor, T.
dc.contributor.author
Rujirawat, S.
dc.contributor.author
Yimnirun, R.
dc.contributor.author
Lin, X. Z.
dc.contributor.author
Ennaoui, A.
dc.contributor.author
Dittrich, Th.
dc.contributor.author
Lux-Steiner, Martha
dc.date.accessioned
2018-06-08T03:13:25Z
dc.date.available
2014-08-26T11:52:47.781Z
dc.identifier.uri
https://refubium.fu-berlin.de/handle/fub188/14705
dc.identifier.uri
http://dx.doi.org/10.17169/refubium-18895
dc.description.abstract
Lattice positions of Sn in kesterite Cu 2ZnSnS4 and Cu 2 SnS 3 nanoparticles
and thin films were investigated by XANES (x-ray absorption near edge
structure) analysis at the S K-edge. XANES spectra were analyzed by comparison
with simulations taking into account anti-site defects and vacancies.
Annealing of Cu 2ZnSnS4 nanoparticle thin films led to a decrease of Sn at its
native and defect sites. The results show that XANES analysis at the S K-edge
is a sensitive tool for the investigation of defect sites, being critical in
kesterite thin film solar cells.
de
dc.rights.uri
http://publishing.aip.org/authors/web-posting-guidelines
dc.subject.ddc
500 Naturwissenschaften und Mathematik::530 Physik
dc.title
Lattice positions of Sn in Cu2ZnSnS4 nanoparticles and thin films studied by
synchrotron X-ray absorption near edge structure analysis
dc.type
Wissenschaftlicher Artikel
dcterms.bibliographicCitation
Applied Physics Letters. - 102 (2013), 22, Artikel Nr.221908/1-4
dc.identifier.sepid
38112
dcterms.bibliographicCitation.doi
10.1063/1.4809824
dcterms.bibliographicCitation.url
http://dx.doi.org/10.1063/1.4809824
refubium.affiliation
Physik
de
refubium.affiliation.other
Institut für Experimentalphysik
refubium.mycore.fudocsId
FUDOCS_document_000000020790
refubium.resourceType.isindependentpub
no
refubium.mycore.derivateId
FUDOCS_derivate_000000003810
dcterms.accessRights.openaire
open access
dcterms.isPartOf.issn
0003-6951
