dc.contributor.author
Schäfer, N.
dc.contributor.author
Klaus, M.
dc.contributor.author
Genzel, C.
dc.contributor.author
Marquart, J.
dc.contributor.author
Schorr, S.
dc.contributor.author
Rissom, T.
dc.contributor.author
Wilkinson, A. J.
dc.contributor.author
Schulli, T.
dc.contributor.author
Schmid, T.
dc.contributor.author
Abou-Ras, Daniel
dc.date.accessioned
2015-08-01
dc.date.available
2015-08-24T05:41:28.894Z
dc.identifier.uri
https://refubium.fu-berlin.de/handle/fub188/14247
dc.identifier.uri
http://dx.doi.org/10.17169/refubium-18442
dc.rights.uri
http://journals.cambridge.org/action/displaySpecialPage?pageId=4608
dc.subject.ddc
500 Naturwissenschaften und Mathematik::550 Geowissenschaften, Geologie
dc.title
Comparison of techniques for strain measurements in CuInSe2 absorber layers of
thin-film solar cells
dc.type
Wissenschaftlicher Artikel
dcterms.bibliographicCitation
Microscopy and Microanalysis. - 20 (2014), Suppl. S3, S. 1464-1465
dcterms.bibliographicCitation.doi
10.1017/S1431927614009052
dcterms.bibliographicCitation.url
http://dx.doi.org/10.1017/S1431927614009052
refubium.affiliation
Geowissenschaften
de
refubium.mycore.fudocsId
FUDOCS_document_000000022369
refubium.resourceType.isindependentpub
no
refubium.mycore.derivateId
FUDOCS_derivate_000000004868
dcterms.accessRights.openaire
open access
