dc.contributor.author
Klar, Philipp
dc.contributor.author
Lidorikis, E.
dc.contributor.author
Eckmann, A.
dc.contributor.author
Verzhbitskiy, Ivan A.
dc.contributor.author
Ferrari, A. C.
dc.contributor.author
Casiraghi, Cinzia
dc.date.accessioned
2018-06-08T02:58:22Z
dc.date.available
2014-04-01T19:18:25.779Z
dc.identifier.uri
https://refubium.fu-berlin.de/handle/fub188/14235
dc.identifier.uri
http://dx.doi.org/10.17169/refubium-18431
dc.description.abstract
We determine the Raman scattering efficiency of the G and 2D peaks in
graphene. Three substrates are used: silicon covered with 300 or 90 nm oxide,
and calcium fluoride (CaF2). On Si/SiOx, the areas of the G and 2D peak show a
strong dependence on the substrate due to interference effects, while on CaF2
no significant dependence is detected. Unintentional doping is reduced by
placing graphene on CaF2. We determine the Raman scattering efficiency by
comparison with the 322 cm−1 peak area of CaF2. At 2.41 eV, the Raman
efficiency of the G peak is ∼200×10−5 m−1Sr−1, and changes with the excitation
energy to the power of 4. The 2D Raman efficiency is at least one order of
magnitude higher than that of the G peak, with a different excitation energy
dependence.
en
dc.rights.uri
http://forms.aps.org/author/copytrnsfr.pdf
dc.subject.ddc
500 Naturwissenschaften und Mathematik::530 Physik
dc.title
Raman scattering efficiency of graphene
dc.type
Wissenschaftlicher Artikel
dcterms.bibliographicCitation
Physical Review B. - 87 (2013), 20, Artikel Nr. 205435/1-12
dc.identifier.sepid
33244
dcterms.bibliographicCitation.doi
10.1103/PhysRevB.87.205435
dcterms.bibliographicCitation.url
http://dx.doi.org/10.1103/PhysRevB.87.205435
refubium.affiliation
Physik
de
refubium.affiliation.other
Institut für Experimentalphysik
refubium.mycore.fudocsId
FUDOCS_document_000000020076
refubium.resourceType.isindependentpub
no
refubium.mycore.derivateId
FUDOCS_derivate_000000003373
dcterms.accessRights.openaire
open access
dcterms.isPartOf.issn
1098-0121