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New methods in the analysis of electron density and electron localizability - applications to X-O-X systems (X = C, Si) | 334 |
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New methods in the analysis of electron density and electron localizability - applications to X-O-X systems (X = C, Si) | 4 | 2 | 2 | 6 | 4 | 4 | 6 |
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Doktorarbeit.pdf | 77 |