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New methods in the analysis of electron density and electron localizability - applications to X-O-X systems (X = C, Si) | 466 |
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New methods in the analysis of electron density and electron localizability - applications to X-O-X systems (X = C, Si) | 4 | 16 | 12 | 16 | 11 | 23 | 3 |
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Doktorarbeit.pdf | 124 |