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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 400 |
| Januar 2025 | Februar 2025 | März 2025 | April 2025 | Mai 2025 | Juni 2025 | Juli 2025 | |
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| Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy | 24 | 10 | 2 | 2 | 15 | 8 | 0 |
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| oe-22-15-17948.pdf | 420 |
