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Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 260 |
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Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 1 | 6 | 6 | 14 | 13 | 3 | 2 |
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PhysRevB.94.045302.pdf | 434 |