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| Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 192 |
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| Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 0 | 0 | 2 | 0 | 0 | 1 | 1 |
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| PhysRevB.94.045302.pdf | 278 |
