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| Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 318 |
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| Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 4 | 1 | 11 | 25 | 13 | 3 | 3 |
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| PhysRevB.94.045302.pdf | 514 |
