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| Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 367 |
| October 2025 | November 2025 | December 2025 | January 2026 | February 2026 | March 2026 | April 2026 | |
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| Triplet excitons as sensitive spin probes for structure analysis of extended defects in microcrystalline silicon | 25 | 13 | 3 | 19 | 6 | 18 | 9 |
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| PhysRevB.94.045302.pdf | 548 |
