id,collection,dc.contributor.author,dc.date.accessioned,dc.date.available,dc.date.issued,dc.description.abstract[en],dc.format.extent,dc.identifier.sepid,dc.identifier.uri,dc.language,dc.rights.uri,dc.subject.ddc,dc.subject[en],dc.title,dc.type,dcterms.accessRights.openaire,dcterms.bibliographicCitation.doi,dcterms.bibliographicCitation.journaltitle,dcterms.bibliographicCitation.number,dcterms.bibliographicCitation.originalpublishername,dcterms.bibliographicCitation.originalpublisherplace,dcterms.bibliographicCitation.pageend,dcterms.bibliographicCitation.pagestart,dcterms.bibliographicCitation.url,dcterms.bibliographicCitation.volume,dcterms.isPartOf.eissn,dcterms.isPartOf.issn,dcterms.rightsHolder.url,refubium.affiliation,refubium.affiliation.other,refubium.note.author[en],refubium.resourceType.isindependentpub "4acfcb80-1d54-4065-9cff-56eb96b1cc75","fub188/16","Kirchhof, Jan Niklas||Yu, Yuefeng||Antheaume, Gabriel||Gordeev, Georgy||Yagodkin, Denis||Elliott, Peter||de Araújo, Daniel B.||Sharma, Sangeeta||Reich, Stephanie||Bolotin, Kirill I.","2023-03-06T13:06:27Z","2023-03-06T13:06:27Z","2022","We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a high Q silicon nitride nanomechanical resonator illuminated by a wavelength-tunable laser source. From the heating-related frequency shift of the resonator as well as its optical reflection measured as a function of photon energy, we obtain the real and imaginary parts of the dielectric function. Our measurements are unaffected by substrate-related screening and do not require any assumptions on the underling optical constants. This fast (τrise ∼ 135 ns), sensitive (noise-equivalent power = 90⁣pW√Hz), and broadband (1.2–3.1 eV, extendable to UV–THz) method provides an attractive alternative to spectroscopic or ellipsometric characterization techniques.","19 Seiten (Manuskriptversion)","91600","https://refubium.fu-berlin.de/handle/fub188/38045||http://dx.doi.org/10.17169/refubium-37761","eng","http://www.fu-berlin.de/sites/refubium/rechtliches/Nutzungsbedingungen","500 Naturwissenschaften und Mathematik::530 Physik::539 Moderne Physik","Nanomechanical resonators||NEMS||Spectroscopy||2D materials||Transition metal dichalcogenides (TMDs)||Silicon nitride","Nanomechanical spectroscopy of 2D materials","Wissenschaftlicher Artikel","open access","10.1021/acs.nanolett.2c01289","Nano letters","20","ACS Publications","Washington, DC","8044","8037","https://pubs.acs.org/doi/10.1021/acs.nanolett.2c01289","22 (2022)","1530-6992","1530-6984","https://pubs.acs.org/page/copyright/journals/posting_policies.html","Physik","Institut für Experimentalphysik:::0e15dd66-95f1-40d5-8307-e68203f86a76:::600","""This document is the unedited Author's version of a Submitted Work that was subsequently accepted for publication in Nano Letters, copyright © 2022 The Authors. Published by American Chemical Society after peer review. To access the final edited and published work see https://pubs.acs.org/doi/10.1021/acs.nanolett.2c01289.""","no"